Plasma Semiconductor Applications
Beamline pressure effect on ion beam transport in ion implanters
10:00 am – 10:30 amIon implanters are one of the most flexible tools used in the manufacture of integrated circuits, with a wide range of chemistries, accelerating energies, implant angles and implant doses. Precision material engineering applications, often requiring implant doses 10-100x larger than the traditional doping steps, typically run at lower throughputs than other applications. To improve the productivity, we need to increase the beam current in ion implanters. One of the beam current loss mechanisms is the ion neutralization by collisions with the residual gas in the beamline. We have carefully measured this loss using controlled beamline pumping tests with some of the key ion species. Reducing the pressure in the beamline improves the beam transport by a different amount for different ion beam species. This learning can be used to engineer optimized vacuum systems for future tool developments and improvements.
- 9:00 am – 9:15 amThe effect of cryogenic substrate cooling on electron energy distribution in inductively coupled plasma
JONGHA AHN (presenter), DEOKHWAN KIM, Chinwook Chung
- 9:15 am – 9:30 amDevelopment of a Transformer-Coupled Plasma Source with Enhanced Radical Delivery and Plasma Ignition for Next-Generation Plasma Processing
Jaehoon Choi (presenter), Tae S Cho
- 9:30 am – 9:45 amDevelopment of a High-Pressure Compatible Self Plasma-Optical Emission Spectrometer for Real-Time Plasma Process Monitoring
Geon Woong Eom (presenter), SangHo Lee, InYong Park, Woo Seok Kang, Min Hur, Dae-Woong Kim
- 9:45 am – 10:00 amTunable antenna array for large area microwave plasma source for semiconductor manufacturing
Giwon Shin (presenter), Jaehoon Choi, Sooyoung Hwang, Jeonghun Kim, Hakmin Kim, Minhee Lee, Tae S Cho, Hyunho Yun
- 10:00 am – 10:30 amBeamline pressure effect on ion beam transport in ion implanters
John (Bon-Woong) Koo (presenter), Frank Sinclair, Paul Murphy